Choosing the right testing equipment is a crucial task for electronics manufacturing. Thankfully, many products on the market are affordable and will meet your testing needs. These include circuit breakers, dielectric withstand (hipot) test sets, oscilloscopes, load banks, and digital generators.
Using an oscilloscope is one of the best ways to check the operation of your electronics. It can provide a high level of insight into your circuit’s operation and is a key piece of equipment for resolving problems.
Oscilloscopes have many applications, including testing electronic engine management systems. They can also help to test serial bus messages. In addition, most oscilloscopes can trigger on pulse widths, and some models also have a strip chart capability. As a result, these features make it possible to record rare electronic events, such as circuit failures.
There are two types of oscilloscopes: analog and digital. An analog scope has a limited bandwidth because it relies on an analog signal amplifier. A digital scope is a standalone instrument with a PC platform.
A circuit breaker is a great way to protect your electrical circuits from overcurrent. But the right type of breaker depends on the application. For example, you can choose between AC, DC, single-phase, three-phase, or a phase-to-phase circuit. The circuit breaker will have different features depending on the type of circuit you are looking to protect.
A microcomputer-based breaker can determine the RMS value of the current in your circuit. This allows the breaker to perform better and faster. The microcomputer can take many samples of the current waveform per second and calculate the true RMS value of the current. Even with harmonic distortions, the microcomputer can determine the true RMS value of the current.
Dielectric withstand (hipot) test sets
Using dielectric withstand (hipot) test sets for electronics manufacturing is essential to maintaining the safety and quality of an electrical device. A hipot test is a method of detecting possible design defects and workmanship flaws.
When conducting a hipot test, the test operator should be careful to operate the equipment with safety in mind. For example, if the equipment connects to the main power supply, an emergency switch should help to cut off the mains power immediately.
Increasing electricity production and growing demand for electrical energy worldwide have led to an increased demand for load banks. Today, load banks help to test power sources and battery systems. So, they can be purchased, rented, or permanently installed at a site.
Load banks come in several different types. The most common types are resistive and inductive load banks. These are essential for testing AC power supplies, DC power supplies, generators, UPS systems, electrical distribution panels, and more.
In-circuit component testing (ICT)
Printed Circuit Boards (PCBs) are the core of electronic products. They are complex assemblies containing hundreds of electronic components. These boards are often green in color. There are thousands of solder connections on the board.
In-Circuit testing is an advanced type of PCB component testing. This type of testing is highly accurate and delivers component-level fault diagnosis. It also delivers consistency and reliability.
Various advanced testing equipment is available in the market to test the operation of electronics projects. This equipment are helpful in all kinds of electrical and electronic industries. They measure various circuit parameters such as voltage, current, resistance, and continuity. In addition, this equipment helps to analyze circuits.
A digital generator is an electronic testing equipment that produces electronic signals. It simulates the operation of a device under test. So, it is essential for testing electronic circuits, electro-acoustic devices, and electro-acoustic products.
Strategies for Testing Electronic Components
Some strategies will ensure that the product is not damaged in the process, whether you are testing a device for safety, security, or power requirements. For example, you might use Test criteria, Test access, and JTAG/boundary-scan techniques.
Developing test access strategies is essential for electronic testing. Choosing components and designing the circuit correctly can be difficult without proper access. These strategies include JTAG, boundary scan, and in-circuit testing.
The Joint Test Action Group (JTAG) developed the JTAG standard to address the challenges of probe access. So, this standard includes a protocol definition, open expandability of register architecture, and non-intrusive standards.
Boundary-scan-based device interconnections tests can be run at high speeds and provide excellent fault diagnostics. As a result, these tests can help detect manufacturing faults.
Different test criteria may be necessary depending on the component for testing. For example, the test criteria may depend on input parameters, such as resistances, voltages, and time intervals. We can perform some of these tests with digital multimeters, the most versatile testing devices available.
For example, a digital multimeter can measure various circuit parameters, such as voltages, currents, resistances, and continuity. These can validate day-to-day maintenance tasks, new designs, and manufacturing processes.
There are several other tests. However, that is not as well known. These include test and screening strategies, the long-term behavior of relevant parameters, and the quality of the end product. These are all introduced in Chapter 8 of this manual.
Pre-defined power-on and power-off periods at fixed current
Using pre-defined power-on and power-off cycles for testing your electronics components is a great way to test your products’ reliability and power efficiency. The key to success is to ensure that the power-on and power-off cycles are properly sequenced. Moreover, it helps reduce long-term reliability and quality degradation in the process.
Performing the best power-on and power-off cycles is a complex process. Depending on the power supply and its tolerance, some designs might require a voltage-sequencing IC to accomplish this task.
In identifying the best power-on and power-off sequence, you might be in the dark about which power-on and power-off devices to use. Sometimes, your microprocessor might power off during the testing process. In such cases, a manual reset is a good option.
Tests that assess the thermal performance and reliability of power electronics components
Using tests that assess the thermal performance and reliability of power electronics components is essential to understand the performance of these devices. Testing can also help identify the potential causes of failure. These tests can help improve understanding of emerging technologies.
Thermal testing measures how components perform when exposed to different environmental conditions. Additionally, it determine the performance of components when exposed to moist or damp atmospheres. This test mimics the operation of a device across a drive cycle.
Temperature uniformity is critical for power electronics performance. A small change in temperature causes a large variation in the failure rate. Therefore, ensuring that the materials used in the heat sink maintain a uniform temperature is also essential.
Using JTAG/boundary-scan techniques in testing electronic components helps to speed up the test process and decrease the cost of testing. It can also generate tremendous business value for an OEM or EMS. In addition, this technology is helpful in high-volume consumer and defense applications, such as computer and telecommunication products.
This test method allows test systems to gain access to boards, ICs, and peripherals without requiring physical probes. Also, this eliminates the need for expensive testing equipment and procedures. Also, it reduces the time necessary to bring up a board in the production process.
The test system generates test vectors that can help to test ICs, memory, and peripherals. It can also be helpful for hardware/software integration testing. In addition, the test system can be beneficial for PCB-level testing.